A silver-nanoparticle/cellulose-nanofiber composite as a highly effective substrate for surface-enhanced Raman spectroscopy

• Yongxin Lu,
• Yan Luo,
• Zehao Lin and
• Jianguo Huang

Beilstein J. Nanotechnol. 2019, 10, 1270–1279, doi:10.3762/bjnano.10.126

• SERS application. This SERS substrate is usable for the trace detection of the analyte. In order to better understand the high SERS activity of the substrate Ag-NP/cellulose-NF–C, finite element method (FEM) modeling was performed to investigate the localized electric field intensity (Emax) of the

• μL aqueous solution of the complementary nucleoside was dripped onto the corresponding paper substrate, and then the SERS spectra were measured after drying under the same experimental conditions as noted above. The finite element method (FEM) modeling of the plasmonic properties of the silver

Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis

• Omur E. Dagdeviren and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70

• approach for the FEM modeling of a tip-less, but otherwise complete qPlus-style sensor setup [26]. This previous model included a tuning fork of length L = 2426.3 µm, width w = 130.7 µm, and thickness τ = 234.1 µm mounted with epoxy glue on a holder made of Macor, with material choices and sensor geometry

Analysis of self-heating of thermally assisted spin-transfer torque magnetic random access memory

• Austin Deschenes,
• Sadid Muneer,
• Mustafa Akbulut,
• Ali Gokirmak and
• Helena Silva

Beilstein J. Nanotechnol. 2016, 7, 1676–1683, doi:10.3762/bjnano.7.160

• . Keywords: FEM modeling; Joule heating; self-heating; spin torque transfer magnetic random access memory (STT-MRAM); thermoelectrics; Introduction Spin torque transfer magnetic random access memory (STT-MRAM), a type of non-volatile memory, functions through the resistance ratio between the parallel (ON

Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations

• Jens Falter,
• Marvin Stiefermann,
• Gernot Langewisch,
• Philipp Schurig,
• Hendrik Hölscher,
• Harald Fuchs and
• André Schirmeisen

Beilstein J. Nanotechnol. 2014, 5, 507–516, doi:10.3762/bjnano.5.59

• the formula show large discrepancies up to a factor of 5. In the next step we use extensive finite element method (FEM) modeling of the precise geometry of the tuning fork sensor in order to understand these deviations. The simulations show quantitative agreement with the beam formula if the beam